Protein size measurement as dilute as 0.Sample concentrations from 0.1ppm to 40%w/v.Molecular weight measurement down to 980Da.Zeta potential of proteins and particles from 3.8nm up to 100 microns (diameter) using patented M3-PALS technology.Size measurement from 0.3nm (diameter) to 10 microns using patented NIBS (Non-Invasive Back Scatter) technology.The system can be connected to an GPC / SEC system to use as a chromatography detector. The true power of the Nano optical configuration over other light scattering systems can be seen in Figure 4, which shows a comparison of the concentration dependent DLS results obtained for a 200nm polystyrene latex standard measured both at the center of the sample cell and at a position determined automatically by the Zetasizer Nano.
MALVERN ZETASIZER SAMPLE POSITION PLUS
It includes 2 angle size measurement for the enhanced detection of aggregates, measurement of small or dilute samples, or at high concentration, zeta potential and electrophoretic mobility measurement, plus molecular size and molecular weight measurement. The Zetasizer Nano ZS is the top of the Zetasizer range and is particularly suitable where there are a wide range of applications and the highest performance is required. The station also comes with an integrated vacuum system that comprises of a turbo vacuum pump capable for pumping down the pressure within the chamber to just under 5 μTorr enabling low-pressure experimentation. A control heater allows precise sample stage temperature control, and along with the radiation shield heater, provides the probe station with fast thermal response. The station operates over a temperature range of 4.2 K to 475 K and provides for an efficient temperature operation and control with a continuous refrigeration system using either liquid helium or liquid nitrogen. The probe station also allows for optical access through to the sample stage which helps facilitate optical imaging and other transmission experiments. The station is configured with up to four micro-manipulated probe arms, each providing precise 3-axis control of the probe position to accurately land the probe tip on the device features. The probe-station may be used as a platform for measurement of electrical, electro-optical, parametric, DC, RF, and microwave properties of materials and test devices.
MALVERN ZETASIZER SAMPLE POSITION FULL
A versatile, table-top cryogenic micromanipulated probe station used for non-destructive testing of devices on full / partial wafers.
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